2017-Sustainable Industrial Processing Summit
SIPS 2017 Volume 8: Surfaces and Interfaces(SISAM), Composite, Ceramic and Nanomaterials

Editors:Kongoli F, Braems I, Demange V, Dubois JM, Pech-Canul M, Patino CL, Fumio O
Publisher:Flogen Star OUTREACH
Publication Year:2017
Pages:249 pages
ISBN:978-1-987820-75-1
ISSN:2291-1227 (Metals and Materials Processing in a Clean Environment Series)
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    Applications of the Proton Induced X-Ray Emission (Pixe) Technique for Elemental Analysis of Materials

    Gregory Lapicki1;
    1EAST CAROLINA UNIVERSITY, Greenville, United States;
    Type of Paper: Keynote
    Id Paper: 120
    Topic: 42

    Abstract:

    Background. The relevance of x-ray production cross sections (XRPCS) and the related ionization cross sections (ISC) in many research as has been described at length and analyzed in detail [Miranda and Lapicki 2014]. X-ray emission cross sections by ion impact are a relevant input in many areas such as e.g., as for studies of track structure in DNA [Lekadir et al. 2009] or in water [Backstrom et al. 2013]. Particle Induced X-ray Emission (PIXE) strongly requires trustworthy databases for XRPCS and/or reliable predictions of inner-shell ionization theories as periodically evaluated in Monte Carlo Geant4 simulations [Pia et al. 2010 Incerti et al. 2015].
    Purpose. To present 1) a review of the PIXE technique and its applications, and 2) universal experimental and theoretical [ECUSAR theory of Lapicki 2001] fits to existing databases for K- and L-shell XRPCS.
    Goals. To check if the theory is accurate across the periodic table of elements and a large range of projectile energies, equally comprehensive databases are essential and a universal fit for them is desired. Those fits should be in terms of a variable by which XRPCS are scaled with a minimum of adjustable parameters.
    Conclusions. The versatility of the PIXE technique and its application will be demonstrated. It will be shown how universal experimental and theoretical fits to XRPCS serve to set reliable predictions across projectile energies and a wide range of target elements for accurate analysis of elements in materials.

    Keywords:

    Atomic structures; Surfaces and interfaces;

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    Cite this article as:

    Lapicki G. (2017). Applications of the Proton Induced X-Ray Emission (Pixe) Technique for Elemental Analysis of Materials. In Kongoli F, Braems I, Demange V, Dubois JM, Pech-Canul M, Patino CL, Fumio O (Eds.), Sustainable Industrial Processing Summit SIPS 2017 Volume 8: Surfaces and Interfaces(SISAM), Composite, Ceramic and Nanomaterials (pp. 82-83). Montreal, Canada: FLOGEN Star Outreach