To upgrade the lifetime of mechanical product in transportation, parametric accelerated life testing (ALT) was conducted utilizing a quantum/transported life-stress and sample size model. This reliability method included: (1) a lifetime estimate goal based on BX life with an ALT tactic, (2) an examination of the fatigue load that occurred in transit based on a quantum-transported prototype, (3) a performance of ALTs with changes in design, and (4) in each ALT, a judgement whether the product attained the desired BX lifetime. A stress model developed from an energy balance at the quantum level was formulated. A sample size for producing reliability quantitative (RQ) statements was also proposed. To demonstrate this parametric ALT, refrigerator fatigue failures which occurred during rail transit were evaluated by applying the equivalent raised damage potential which was expressed by the power spectral density (PSD). In the first ALT, for RQ statements (40 min), refrigerant tubes in the refrigerator and soldering in the inverter PCB mounted on rubber made of ethylene propylene diene monomer (EPDM) suffered fatigue failure due to an insufficient damping that was caused from the problems in the design of the compressor. The failure during the first ALT was similar to those found in failed refrigerators from the field.  When the rubber mounts and tubes in the compressor were redesigned, there were no issues in the second ALT. The refrigerator thus achieved the desired B1 life during transport.

To enhance the lifetime of mechanical system such as automobile, new reliability methodology – parametric Accelerated Life Testing (ALT) – suggests to produce the reliability quantitative (RQ) specifications—mission cycle—for identifying the design defects and modifying them [1]. It incorporates: (1) a parametric ALT plan formed on system BX lifetime that will be X percent of the cumulated failure, (2) a load examination for ALT, (3) a customized parametric ALTs with the design alternatives, and (4) an assessment if the system design(s) fulfil the objective BX lifetime. So we suggest a BX life concept, life-stress (LS) model with a new effort idea, accelerated factor, and sample size equation. This new parametric ALT should help an engineer to discover the missing design parameters of the mechanical system influencing reliability in the design process. As the improper designs are experimentally identified, the mechanical system can recognize the reliability as computed by the growth in lifetime, LB, and the decrease in failure rate. Consequently, companies can escape recalls due to the product failures from the marketplace. As an experiment instance, two cases were investigated: 1) problematic reciprocating compressors in the French-door refrigerators returned from the marketplace and 2) the redesign of hinge kit system (HKS) in a domestic refrigerator. After a customized parametric ALT, the mechanical systems such as compressor and HKS with design alternatives were anticipated to fulfil the lifetime – B1 life 10 year.