Short Bio:
Dr. Tan earned his Ph.D. in Electrical Engineering from the University of Toronto in 1992. With a decade of industry experience in electronic reliability, he transitioned to academia, serving as a faculty member at Nanyang Technological University (NTU) from 1996 to 2014. Later, he was invited to join Chang Gung University in Taiwan, where he established and directs the Research Center on Reliability Sciences and Technologies. Currently, he holds the position of Professor in the Electronic Department at Chang Gung University and serves as Honorary Chair Professor at Ming Chi University of Technology, Taiwan.
Dr. Tan's extensive contributions to the field include over 400 international journal and conference papers, along with numerous keynotes and invited talks at prestigious international conferences. He holds 21 patents and a copyright on reliability software. Additionally, he has authored 14 books and book chapters focusing on reliability. He was also invited to give tutorials in various international conferences, such as IEEE IRPS 2025, IEEE IPFA etc. His editorial roles include serving as an Editor for Scientific Reports by Nature Publishing Group, IEEE Transactions on Device and Materials Reliability (TDMR), and Series Editor for SpringerBrief in Reliability, among others. He is also a member of the advisory panel for Elsevier Publishing Group.
Dr. Tan has been helping many international companies to advance their products reliability and establish their reliability culture within the companies. The companies he has helped is more than 50, including Motorola, Penang; Microsoft, Seattle; Moxa, Taiwan; Delta Electronics, Taiwan; TSMC, Taiwan; LiteOn, Taiwan; MBI, Taiwan; Aptiv (formerly Delphi), Singapore; LTA Singapore; RSAF Singapore; Luxton, USA; Taiwan Space Agency; to name a few.
Recognized for his expertise, Dr. Tan has been named one of the top 2% scientists worldwide by Stanford University for four consecutive years (2021-2024) and received a life achievement award for being among the top 0.15% of world scientists from 1961 to 2024. He also was named a 2024 Top 30 Reliability Scholar in the world by ScholarGPS, ranked as top 0.5% of scholars globally based on lifetime scholarly impact.
Dr. Tan is a Distinguished Lecturer for the IEEE Electronic Device Society on reliability. Furthermore, he has been honored as a Fellow of the Institute of Engineers, Singapore, the Singapore Quality Institute, and the International Association of Advanced Materials in Sweden. He also recently received a Scientist Medal from the International Association of Advanced Materials, Sweden. He was elected to be the President of Taiwan Reliability Technology Association in 2024.
Dr. Tan's dedication to quality and reliability extends to his role as a reviewer for various international journals and his receipt of the Ishikawa-Kano Quality Award in Singapore in 2014. He was also invited to be the President of Taiwan Reliability Technologies Association and Chairman of Reliability Chapter in Chinese Society of Quality, Taiwan. He was invited to join Sigma Xi, the Scientists Research Honor Society where Albert Einstein, Dirac Fermi, etc belonged to. His research interests encompass reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering systems. He also involves in Biomedical physics and engineering with several inventions in medical instrumentation.
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