To upgrade the lifetime of mechanical product in transportation, parametric accelerated life testing (ALT) was conducted utilizing a quantum/transported life-stress and sample size model. This reliability method included: (1) a lifetime estimate goal based on BX life with an ALT tactic, (2) an examination of the fatigue load that occurred in transit based on a quantum-transported prototype, (3) a performance of ALTs with changes in design, and (4) in each ALT, a judgement whether the product attained the desired BX lifetime. A stress model developed from an energy balance at the quantum level was formulated. A sample size for producing reliability quantitative (RQ) statements was also proposed. To demonstrate this parametric ALT, refrigerator fatigue failures which occurred during rail transit were evaluated by applying the equivalent raised damage potential which was expressed by the power spectral density (PSD). In the first ALT, for RQ statements (40 min), refrigerant tubes in the refrigerator and soldering in the inverter PCB mounted on rubber made of ethylene propylene diene monomer (EPDM) suffered fatigue failure due to an insufficient damping that was caused from the problems in the design of the compressor. The failure during the first ALT was similar to those found in failed refrigerators from the field.  When the rubber mounts and tubes in the compressor were redesigned, there were no issues in the second ALT. The refrigerator thus achieved the desired B1 life during transport.